MOSFET dosimetry of an X-ray microbeam

被引：0
|
作者：
Rosenfeld, A.B. [1 ]
Kaplan, G.I. [1 ]
Kron, T. [1 ]
Allen, B.J. [1 ]
Dilmanian, A. [1 ]
Orion, I. [1 ]
Ren, B. [1 ]
Lerch, M.L.F. [1 ]
Holmes-Siedle, A. [1 ]
机构：
[1] Univ of Wollongong, Wollongong
来源：
IEEE Transactions on Nuclear Science | 1999年 / 46卷 / 6 I期
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页码：1774 / 1780
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