Integrated design and test of mixed-signal circuits

被引：0
|
作者：
Engin, Nur [1 ,2 ]
Kerkhoff, Hans G. [1 ,3 ,4 ]
Tangelder, Ronald J. W. T. [1 ]
Speek, Han [1 ,5 ]
机构：
[1] MESA Research Institute, University of Twente, P.O. Box 217, 7500 AE Enschede, Netherlands
[2] Middle East Technical University, Ankara, Turkey
[3] Test Company Advantest, San Jose, CA, United States
[4] Philips Research Laboratories, Eindhoven, Netherlands
[5] Polytechnical Highschool, Enschede, Netherlands
来源：
Journal of Electronic Testing: Theory and Applications (JETTA) | 1999年 / 14卷 / 01期
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页码：75 / 83
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