Long-term (>30,000-40,000 h) creep behavior of an advanced Si3N4 ceramic

被引：0
|
作者：
Liu, K.C. [1 ]
Lin, H.T. [1 ]
Stevens, C.O. [1 ]
Brinkman, C.R. [1 ]
机构：
[1] Oak Ridge Natl Lab, Oak Ridge, United States
来源：
Key Engineering Materials | 1997年 / 132-136卷 / Pt 1期
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页码：583 / 586
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