Atomistic simulation of segregation in Cu-Bi system. I. Saturated segregation

被引:0
|
作者
Wang, Guijin [1 ]
Vitek, V. [1 ]
机构
[1] Central Iron and Steel Research Inst, China
关键词
D O I
暂无
中图分类号
学科分类号
摘要
11
引用
收藏
页码:1 / 6
相关论文
共 50 条
  • [41] PHASE DIAGRAM OF AL-BI-CU SYSTEM IN AL-AL CU-BI RANGE
    MARTINGARIN, R
    ALLIBERT, M
    DESRE, P
    BONNIER, E
    BULLETIN DE LA SOCIETE CHIMIQUE DE FRANCE, 1968, (09): : 3539 - +
  • [42] An atomistic surface simulation study predicting morphologies and segregation in yttrium lithium fluoride
    Littleford, Thomas E.
    Jackson, Robert A.
    Read, Mark S. D.
    SURFACE SCIENCE, 2012, 606 (19-20) : 1550 - 1555
  • [43] Simulation and Measurement of Vapor-Liquid Equilibrium of Cu-Bi and Cu-Bi-Ag Alloys in Vacuum Distillation
    Du, Yi
    Kong, Lingxin
    Chen, Liangliang
    Xu, Baoqiang
    Yang, Bin
    METALLURGICAL AND MATERIALS TRANSACTIONS B-PROCESS METALLURGY AND MATERIALS PROCESSING SCIENCE, 2025,
  • [44] Grain-boundary melting phase transition in the Cu-Bi system
    Divinski, S
    Lohmann, M
    Herzig, C
    Straumal, B
    Baretzky, B
    Gust, W
    PHYSICAL REVIEW B, 2005, 71 (10):
  • [45] Chemistry and bonding changes associated with the segregation of Bi to grain boundaries in Cu
    Keast, VJ
    Bruley, J
    Rez, P
    Maclaren, JM
    Williams, DB
    ACTA MATERIALIA, 1998, 46 (02) : 481 - 490
  • [46] EMBRITTLEMENT OF CU [110] SYMMETRICAL TILT BOUNDARIES INDUCED BY BI SEGREGATION
    MIURA, H
    YOSHIDA, T
    SAKAI, T
    KATO, M
    MORI, T
    JOURNAL OF THE JAPAN INSTITUTE OF METALS, 1993, 57 (05) : 479 - 485
  • [47] Stem analysis of the segregation of Bi to Σ19a grain boundaries in Cu
    Sigle, W
    Chang, LS
    Gust, W
    Rühle, M
    ADVANCES IN MATERIALS PROBLEM SOLVING WITH THE ELECTRON MICROSCOPE, 2001, 589 : 307 - 310
  • [48] Phase Field Simulation of Segregation of the Bi-riched Phase in Cu/Sn-Bi/Cu Solder Interconnects under Electric Current Stressing
    Liang, Shui-Bao
    Ke, Chang-Bo
    Ma, Wen-Jing
    Zhou, Min-Bo
    Zhang, Xin-Ping
    2016 IEEE 66TH ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC), 2016, : 264 - 270
  • [49] A REEVALUATION OF INVERSE SEGREGATION IN THE AL(RICH)-CU SYSTEM
    CAHOON, JR
    MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 1994, 188 (1-2): : 211 - 217
  • [50] Segregation Defects in VAR Titanium Alloys: I. Common Defects
    E. N. Kondrashov
    K. A. Rusakov
    N. V. Shchetnikov
    M. O. Leder
    Russian Metallurgy (Metally), 2022, 2022 : 553 - 558