Quantitative Analysis of the Surface of Steel by Ion Microanalysis.

被引：0
|
作者：
Servais, J.P.
Graas, H.
Leroy, V.
Habraken, L.
机构：
来源：
Vide | 1976年 / 31卷 / 181期
关键词：
MICROANALYSIS;
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学科分类号：
摘要：
Taking into account the experimental and theoretical data on sputtering and secondary ion emission phenomena induced during the bombardment of a metal or an oxide surface by a primary ion beam, it is possible to determine the experimental conditions for quantitative chemical analysis of the steel surface by the ion probe microanalyzer. This method of quantitative analysis is illustrated in the case of a thin oxide layer formed on an AISI 304 stainless steel.
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页码：27 / 29
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