COMPLEMENTARY METAL-OXIDE-SEMICONDUCTOR STRUCTURE WITH TRENCH ISOLATION.

被引:0
|
作者
Chesebro, D.G.
El-Kareh, B.
机构
来源
IBM technical disclosure bulletin | 1984年 / 27卷 / 05期
关键词
D O I
暂无
中图分类号
TN [电子技术、通信技术];
学科分类号
0809 ;
摘要
A complementary metal-oxide-semiconductor (CMOS) structure is provided which uses trench isolation refilled with polyimide that inhibits latch up. The structure includes an N type semiconductor substrate with an implanted P type pocket. Alternatively, an N plus substrate may be used on which an N type silicon layer is epitaxially grown.
引用
收藏
相关论文
共 50 条
  • [1] A Superjunction Schottky Barrier Diode With Trench Metal-Oxide-Semiconductor Structure
    Wang, Ying
    Xu, Likun
    Miao, Zhikun
    IEEE ELECTRON DEVICE LETTERS, 2012, 33 (12) : 1744 - 1746
  • [2] Mitigation of Complementary Metal-Oxide-Semiconductor Variability with Metal Gate Metal-Oxide-Semiconductor Field-Effect Transistors
    Yang, Ji-Woon
    Park, Chang Seo
    Smith, Casey E.
    Adhikari, Hemant
    Huang, Jeff
    Heh, Dawei
    Majhi, Prashant
    Jammy, Raj
    JAPANESE JOURNAL OF APPLIED PHYSICS, 2009, 48 (04)
  • [3] A study of the trench-isolation effect on electrophysical characteristics of submicron metal-oxide-semiconductor transistors
    Bugaev, AS
    Shibkov, AA
    JOURNAL OF COMMUNICATIONS TECHNOLOGY AND ELECTRONICS, 1998, 43 (11) : 1312 - 1315
  • [4] Vacuum gauging with complementary metal-oxide-semiconductor microsensors
    Paul, O.
    Brand, O.
    Lenggenhager, R.
    Baltes, H.
    Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films, 1995, 13 (03): : 503 - 508
  • [5] VACUUM GAUGING WITH COMPLEMENTARY METAL-OXIDE-SEMICONDUCTOR MICROSENSORS
    PAUL, O
    BRAND, O
    LENGGENHAGER, R
    BALTES, H
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1995, 13 (03): : 503 - 508
  • [6] Influence of crystal originated particles on gate oxide integrity of metal-oxide-semiconductor capacitors with shallow trench isolation
    Koh, CG
    Yeo, IS
    Pyi, SH
    Lee, SK
    JOURNAL OF THE KOREAN PHYSICAL SOCIETY, 1999, 35 : S1038 - S1042
  • [7] Low-k dielectrics for trench isolation in nanoscaled complementary metal oxide semiconductor imagers
    Irrera, F.
    Puzzilli, G.
    Ricci, L.
    Russo, F.
    Stirpe, F.
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2009, 27 (01): : 517 - 520
  • [8] The Impact of Technology Scaling for RF Complementary Metal-Oxide-Semiconductor
    Morifuji, Eiji
    Kimijima, Hideki
    Kojima, Kenji
    Iwai, Masaaki
    Matsuoka, Fumitomo
    JAPANESE JOURNAL OF APPLIED PHYSICS, 2009, 48 (01)
  • [9] Fabrication of 0.1 μm complementary metal-oxide-semiconductor devices
    Yoshimura, Toshiyuki
    Aoki, Masaaki
    Ishi, Tatsuya
    Okazaki, Shinji
    Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 1991, 30 (11 B): : 3277 - 3281
  • [10] New aspects of nanopotentiometry for complementary metal-oxide-semiconductor transistors
    Trenkler, T
    Stephenson, R
    Jansen, P
    Vandervorst, W
    Hellemans, L
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2000, 18 (01): : 586 - 594