Determination of Thickness of Thin Films by Differential Interferometer.

被引：0

作者：

Lebowsky, F.

Li, P.S.

机构：

来源：

| 1600年 / 95期

关键词：

D O I：

暂无

中图分类号：

学科分类号：

摘要：

引用

共 50 条

[21] DETERMINATION OF THE THICKNESS OF THIN POROUS OXIDE FILMS ON ALUMINUM
HUNTER, MS
TOWNER, PF
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1960, 107 (03) : C56 - C56
[22] MEASUREMENT OF THE THICKNESS OF THIN-FILMS WITH ROUGH SURFACES BY A MODIFIED MICHELSON INTERFEROMETER
HERRMANN, PP
STAEHLI, H
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1983, 16 (11): : 1072 - 1075
[23] Detection of HF by a porous silicon interferometer.
Létant, SE
Sohn, HL
Trogler, WC
Sailor, MJ
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1999, 218 : U888 - U888
[24] DIFFERENTIAL METHOD FOR DETERMINING THICKNESS OF THIN FILMS WITH TWOQUARTZ GENERATORS
SOROKIN, OM
INSTRUMENTS AND EXPERIMENTAL TECHNIQUES-USSR, 1969, (06): : 1563 - &
[25] DETERMINATION OF DISPERSION OF LIQUIDS OR SOLID TRANSPARENT MATERIALS USING SCATTER PLATE INTERFEROMETER.
Shukla, R.P.'
Murty, M.V.R.K.
Indian Journal of Pure and Applied Physics, 1988, 26 (01): : 9 - 11
[26] MEASURING THICKNESS OF THIN TRANSPARENT FILMS BY MEANS OF A TYPE MII-4 INTERFEROMETER
MILOSLAVSKII, VK
RYAZANOV, AN
MEASUREMENT TECHNIQUES, 1974, 17 (04) : 548 - 551
[27] A modification of Michelson's Beam Interferometer.
Synge, EH
PHILOSOPHICAL MAGAZINE, 1930, 10 (63): : 291 - 297
[28] PHASE RELATIONS IN A MICHELSON LASER INTERFEROMETER.
Yakobi, Yu.A.
1600, (17):
[29] On the forms of curves presented by the michelson interferometer.
Shedd, JC
PHYSICAL REVIEW, 1900, 11 (05): : 304 - 315
[30] NONRECIPROCITY EFFECT IN A FIBER RING INTERFEROMETER.
Bazarov, E.N.
Izraelyan, V.G.
Sverchkov, E.I.
Telegin, G.I.
Chamorovskii, Yu.K.
Soviet journal of quantum electronics, 1981, 8 (08): : 1103 - 1105

← 1 2 3 4 5 →