A low-temperature scanning near-field optical microscope for photoluminescence at semiconductor structures

被引：0
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作者：
Manke, I. [1 ]
Pahlke, D. [1 ]
Lorbacher, J. [1 ]
Busse, W. [1 ]
Kalka, T. [1 ]
Richter, W. [1 ]
Dähne-Prietsch, M. [1 ]
机构：
[1] Institut für Festkörperphysik, Technische Universität Berlin, Hardenbergstrasse 36, D-10623 Berlin, Germany
来源：
Applied Physics A: Materials Science and Processing | 1998年 / 66卷 / SUPPL. 1期
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