Software system of objects measurement modeling

被引:0
|
作者
Zhong, Yongmin
Yang, Haicheng
机构
关键词
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
页码:329 / 331
相关论文
共 50 条
  • [31] Software reliability modeling using skewed measurement data
    Van Hulse, Jason
    Khoshgoftaar, Taghi M.
    Napolitano, Amri
    THIRTEENTH ISSAT INTERNATIONAL CONFERENCE ON RELIABILITY AND QUALITY IN DESIGN, PROCEEDINGS, 2007, : 181 - +
  • [32] Measurement and modeling of the peer-to-peer sharing objects popularity
    Guo, Zhen-Bin
    Qiu, Zheng-Ding
    Tongxin Xuebao/Journal on Communication, 2009, 30 (03): : 66 - 74
  • [33] The use of the EPOS software package for research of the solar system objects
    V. N. L’vov
    S. D. Tsekmeister
    Solar System Research, 2012, 46 : 177 - 179
  • [34] Hardware and Software System Acoustic Control Environmentally Hazardous Objects
    Ovcharuk, V. N.
    Konstantinov, N. K.
    Maximova, I. S.
    2013 INTERNATIONAL SIBERIAN CONFERENCE ON CONTROL AND COMMUNICATIONS (SIBCON), 2013,
  • [35] The use of the EPOS software package for research of the solar system objects
    L'vov, V. N.
    Tsekmeister, S. D.
    SOLAR SYSTEM RESEARCH, 2012, 46 (02) : 177 - 179
  • [36] A hardware-software system for the magnetographic inspection of ferromagnetic objects
    Kushner, A. V.
    Shilov, A. V.
    Novikov, V. A.
    RUSSIAN JOURNAL OF NONDESTRUCTIVE TESTING, 2010, 46 (06) : 421 - 423
  • [37] A hardware-software system for the magnetographic inspection of ferromagnetic objects
    A. V. Kushner
    A. V. Shilov
    V. A. Novikov
    Russian Journal of Nondestructive Testing, 2010, 46 : 421 - 423
  • [38] Software in Measurement and Measurement in Software
    Barford, Lee
    IEEE INSTRUMENTATION & MEASUREMENT MAGAZINE, 2015, 18 (03) : 40 - 41
  • [39] Impedance spectroscopy measurement system for technical objects diagnostics
    Hoja, Jerzy
    Lentka, Grzegorz
    PRZEGLAD ELEKTROTECHNICZNY, 2011, 87 (10): : 204 - 207
  • [40] Research on software architecture of distributed measurement system
    Mi Jie
    Sun Xin
    Proceedings of the First International Symposium on Test Automation & Instrumentation, Vols 1 - 3, 2006, : 664 - 667