Thermodynamic aspect of the wire-bonding process

被引:0
|
作者
Falk, J. [1 ]
机构
[1] Degussa AG, Rheinfelden, Germany
关键词
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
页码:23 / 31
相关论文
共 50 条
  • [41] Investigation of the Capacitance Compensation Structure for Wire-Bonding Interconnection in Multi Chips Module
    Zhu, Hao-Ran
    Sun, Yu-Fa
    Wu, Xian-Liang
    2017 IEEE ELECTRICAL DESIGN OF ADVANCED PACKAGING AND SYSTEMS SYMPOSIUM (EDAPS), 2017,
  • [42] Exploration of Interfacial Materials Chemistry Control to Improve Cu Wire-Bonding Reliability
    Durai, Kevin Antony Jesu
    Kumaravel, Dinesh Kumar
    Alptekin, John
    Estridge, Logan
    Nair, Shyam
    Chyan, Oliver
    Journal of Microelectronics and Electronic Packaging, 2024, 21 (02): : 42 - 49
  • [43] Time evolution of strain distribution under bonding pad during ultrasonic wire-bonding at 200°C
    Sakamoto, Mamoru
    Nakadozono, Kenichi
    Iwanabe, Keiichiro
    Asano, Tanemasa
    2017 IEEE CPMT SYMPOSIUM JAPAN (ICSJ), 2017, : 149 - 152
  • [44] Piezocomposite ultrasonic transducer for high-frequency wire-bonding of microelectronics devices
    Or, Siu Wing
    Chan, Helen Lai Wa
    Liu, Peter Chou Kee
    SENSORS AND ACTUATORS A-PHYSICAL, 2007, 133 (01) : 195 - 199
  • [45] Piezo-FET stress-sensor arrays for wire-bonding characterization
    Doelle, M
    Peters, C
    Ruther, P
    Paul, O
    JOURNAL OF MICROELECTROMECHANICAL SYSTEMS, 2006, 15 (01) : 120 - 130
  • [46] Design concept for wire-bonding reliability improvement by optimizing position in power devices
    Ishiko, M
    Usui, M
    Ohuchi, T
    Shirai, M
    MICROELECTRONICS JOURNAL, 2006, 37 (03) : 262 - 268
  • [47] Flexible Optoelectric Neural Interface Integrated Wire-Bonding μLEDs and Microelectrocorticography for Optogenetics
    Ji, Bowen
    Wang, Minghao
    Kang, Xiaoyang
    Gu, Xiaowei
    Li, Chengyu
    Yang, Bin
    Wang, Xiaolin
    Liu, Jingquan
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2017, 64 (05) : 2008 - 2015
  • [48] Enhancing Cu Wire-Bonding Reliability by a Cu-Selective Passivation Coating
    Kumaravel, Dinesh Kumar
    Durai, Kevin Antony Jesu
    Nair, Shyam M.
    Nair, Shinoj S.
    Yu, Hailey Huijun
    Alptekin, John
    Chyan, Oliver M. R.
    Mathew, Varughese
    PROCEEDINGS OF THE IEEE 74TH ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE, ECTC 2024, 2024, : 1206 - 1212
  • [49] Reliability of wire-bonding and solder joint for high temperature operation of power semiconductor device
    Yamada, Y.
    Takaku, Y.
    Yagi, Y.
    Nakagawa, I.
    Atsumi, T.
    Shirai, M.
    Ohnuma, I.
    Ishida, K.
    MICROELECTRONICS RELIABILITY, 2007, 47 (12) : 2147 - 2151
  • [50] PHOTOELECTRIC NEURAL INTERFACE COMBINING WIRE-BONDING μLEDS WITH IRIDIUM OXIDE MICROELECTRODES FOR OPTOGENETICS
    Ji, Bo-Wen
    Kang, Xiao-Yang
    Wang, Ming-Hao
    Bao, Bu-Feng
    Tian, Hong-Chang
    Yang, Bin
    Chen, Xiang
    Wang, Xiao-Lin
    Liu, Jing-Quan
    30TH IEEE INTERNATIONAL CONFERENCE ON MICRO ELECTRO MECHANICAL SYSTEMS (MEMS 2017), 2017, : 538 - 541