共 50 条
- [22] CHARACTERIZATION OF SEMICONDUCTOR SILICON BY TRANSMISSION ELECTRON-MICROSCOPY PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS, 1984, 452 : 170 - 176
- [23] Transmission electron microscopy investigation of semiconductor quantum dots SIMC-XI: 2000 INTERNATIONAL SEMICONDUCTING AND INSULATING MATERIALS CONFERENCE, PROCEEDINGS, 2000, : 217 - 223
- [29] Identification of weak interfaces in composites using transmission electron microscopy JOURNAL OF MICROSCOPY-OXFORD, 2000, 197 : 202 - 205
- [30] In situ observation of solid–liquid interfaces by transmission electron microscopy Journal of Materials Research, 2005, 20 : 1629 - 1640