PROGRAMMABLE UNIT HANDLING/TEST MODULE.

被引：0
|
作者：
Escobar, G.
Neer, J.
机构：
来源：
IBM technical disclosure bulletin | 1984年 / 27卷 / 7 B期
关键词：
DISPLAY DEVICES - Automatic Testing;
D O I：
暂无
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学科分类号：
摘要：
This article describes a high density high volume, low cost, unit handling/test system. This system can be used for applications for computer CPUs, display terminals and similar types of equipment.
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页码：4180 / 4181
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