共 50 条
- [31] Nanometer-scale dimensional metrology with noncontact atomic force microscopy METROLOGY, INSPECTION, AND PROCESS CONTROL FOR MICROLITHOGRAPHY X, 1996, 2725 : 527 - 539
- [34] Aggregation of conjugated polymer nanowires studied by atomic force microscopy and kelvin probe force microscopy ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2017, 254
- [40] Nanometer-scale characterization of ferroelectric polymer thin films by variable-temperature atomic force microscopy JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2000, 39 (6B): : 3830 - 3833