A method for determination of radioactivity and parameters of particles by systems of semiconductors detectors

被引:0
|
作者
Mineev, Yu.V.
机构
关键词
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
页码:30 / 35
相关论文
共 50 条
  • [21] Determination of dynamic model parameters of smoke detectors
    Björkman, J
    Baroudi, D
    Latva, R
    Tuomisaari, M
    Kokkala, M
    FIRE SAFETY JOURNAL, 2002, 37 (04) : 395 - 407
  • [22] DETERMINATION OF PARAMETERS OF DARK-COLORED PARTICLES OF DISPERSE PHASE IN PETROLEUM SYSTEMS
    GILYAZETDINOV, LP
    ALDZHOMAA, M
    CHEMISTRY AND TECHNOLOGY OF FUELS AND OILS, 1994, 30 (3-4) : 128 - 132
  • [23] METHOD FOR DETERMINATION OF CONDUCTION MECHANISM IN SEMICONDUCTORS
    ZVEREV, LP
    MINKOV, GM
    KRUZHAEV, VV
    NEGASHEV, SA
    SOVIET PHYSICS SEMICONDUCTORS-USSR, 1976, 10 (04): : 453 - 453
  • [24] Determination of discrete element method (DEM) simulation parameters for polymeric waste particles
    Martignoni, Alessio
    Iorio, Lorenzo
    Strano, Matteo
    GRANULAR MATTER, 2024, 26 (04)
  • [25] Study on the determination of dynamic parameters of control systems with the perturbation method
    Xue, G.
    Shi, G.
    Wang, Q.
    Liu, Y.
    Zhang, Y.
    Xi Tong Gong Cheng Yu Dian Zi Ji Shu/Systems Engineering and Electronics, 2001, 23 (04): : 67 - 68
  • [26] A strain gage method for determination of fracture parameters in bimaterial systems
    Marur, PR
    Tippur, HV
    ENGINEERING FRACTURE MECHANICS, 1999, 64 (01) : 87 - 104
  • [27] BREMSSTRAHLUNG AND DETERMINATION OF ELECTROMAGNETIC PARAMETERS OF PARTICLES
    ZAKHAROV, VI
    KONDRATY.LA
    PONOMARE.LA
    SOVIET JOURNAL OF NUCLEAR PHYSICS-USSR, 1969, 8 (04): : 456 - &
  • [28] A Change in the Parameters of Si(Li) Detectors under Exposure to α Particles
    Bazlov, N. V.
    Bakhlanov, S. V.
    Derbin, A. V.
    Drachnev, I. S.
    Izegov, G. A.
    Kotina, I. M.
    Muratova, V. N.
    Niyazova, N. V.
    Semenov, D. A.
    Trushin, M. V.
    Unzhakov, E. V.
    Chmel, E. A.
    INSTRUMENTS AND EXPERIMENTAL TECHNIQUES, 2020, 63 (01) : 25 - 29
  • [29] A Change in the Parameters of Si(Li) Detectors under Exposure to α Particles
    N. V. Bazlov
    S. V. Bakhlanov
    A. V. Derbin
    I. S. Drachnev
    G. A. Izegov
    I. M. Kotina
    V. N. Muratova
    N. V. Niyazova
    D. A. Semenov
    M. V. Trushin
    E. V. Unzhakov
    E. A. Chmel
    Instruments and Experimental Techniques, 2020, 63 : 25 - 29
  • [30] UNIQUE DETERMINATION OF PARAMETERS OF SURFACE RECOMBINATION CENTERS IN SEMICONDUCTORS
    MARGONINSKI, Y
    WALZER, Y
    PHYSICAL REVIEW, 1967, 156 (03): : 903 - +