Measurement system for optical bistability of II-VI semiconductor materials

被引：0
|
作者：
Yang, Aihua [1 ]
Chen, Lianchun [1 ]
Fan, Xiwu [1 ]
机构：
[1] Changchun Inst of Physics, Acad Sinica, Changchun, China
来源：
Guangdianzi Jiguang/Journal of Optoelectronics Laser | 1993年 / 4卷 / 04期
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摘要：
(Edited Abstract)
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页码：218 / 219
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