Characteristics and effectiveness of a foil lens for correction of spherical aberration in scanning transmission electron microscopy

被引：0
|
作者：
Department of Electronics, School of Engineering, Nagoya University, Nagoya [1 ]
464-01, Japan
不详 [2 ]
464-01, Japan
机构：
来源：
Microsc. | / 3卷 / 185-192期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
相关论文
共 50 条
  • [41] Aberration correction in electron microscopy
    Rose, H
    Wan, W
    2005 IEEE PARTICLE ACCELERATOR CONFERENCE (PAC), VOLS 1-4, 2005, : 3784 - 3788
  • [42] Aberration correction in electron microscopy
    Rose, Harald
    INTERNATIONAL JOURNAL OF MATERIALS RESEARCH, 2006, 97 (07) : 885 - 889
  • [43] Aberration Correction for Large-Angle Illumination Scanning Transmission Electron Microscopy by Using Iterative Electron Ptychography Algorithms
    Ma, Yinhang
    Shi, Jinan
    Guzman, Roger
    Li, Ang
    Zhou, Wu
    MICROSCOPY AND MICROANALYSIS, 2024, 30 (02) : 226 - 235
  • [44] Improvements in the X-ray analytical capabilities of a scanning transmission electron microscope by spherical-aberration correction
    Watanabe, M.
    Ackland, D. W.
    Burrows, A.
    Kiely, C. J.
    Williams, D. B.
    Krivanek, O. L.
    Dellby, N.
    Murfitt, M. F.
    Szilagyi, Z.
    MICROSCOPY AND MICROANALYSIS, 2006, 12 (06) : 515 - 526
  • [45] Development of a monochromator for aberration-corrected scanning transmission electron microscopy
    Mukai, Masaki
    Okunishi, Eiji
    Ashino, Masanori
    Omoto, Kazuya
    Fukuda, Tomohisa
    Ikeda, Akihiro
    Somehara, Kazunori
    Kaneyama, Toshikatsu
    Saitoh, Tomohiro
    Hirayama, Tsukasa
    Ikuhara, Yuichi
    MICROSCOPY, 2015, 64 (03) : 151 - 158
  • [46] Materials Applications of Aberration-Corrected Scanning Transmission Electron Microscopy
    Pennycook, S. J.
    Chisholm, M. F.
    Lupini, A. R.
    Varela, M.
    van Benthem, K.
    Borisevich, A. Y.
    Oxley, M. P.
    Luo, W.
    Pantelides, S. T.
    ADVANCES IN IMAGING AND ELECTRON PHYSICS, VOL 153, 2008, 153 : 327 - +
  • [47] Correction of spherical aberration for an electrostatic gridded lens
    Pikin, Alexander
    Kponou, Ahovi
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2008, 79 (12):
  • [48] DETERMINATION OF FOIL THICKNESS BY SCANNING-TRANSMISSION ELECTRON-MICROSCOPY
    KELLY, PM
    JOSTSONS, A
    BLAKE, RG
    NAPIER, JG
    PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1975, 31 (02): : 771 - 780
  • [49] INCREASE OF CURRENT-DENSITY OF THE ELECTRON-PROBE BY CORRECTION OF THE SPHERICAL-ABERRATION WITH A SIDE-ENTRY TYPE FOIL LENS
    HANAI, T
    ARAI, S
    HIBINO, M
    JOURNAL OF ELECTRON MICROSCOPY, 1995, 44 (05): : 301 - 306
  • [50] Structural investigation of nanovoids around the interface of micro-vias by spherical aberration corrected scanning transmission electron microscopy
    Hsieh, M. C.
    Nishijima, M.
    Jogo, K.
    Zhang, Z.
    Okumuara, R.
    Yoshida, H.
    Chen, C.
    Suetake, A.
    Honma, H.
    Seto, H.
    Kitahara, Y.
    Kita, K.
    Suganuma, K.
    MICROELECTRONICS RELIABILITY, 2023, 150
12345