Atomic structure of tetrahedral amorphous carbon

被引:6
|
作者
Gilkes, K.W.R. [1 ]
Gaskell, P.H. [1 ]
Yuan, J. [1 ]
机构
[1] Univ of Cambridge, Cambridge, United Kingdom
关键词
Atomic physics - Carbon - Mathematical models - Neutron scattering - Structure (composition);
D O I
10.1016/0022-3093(93)91192-6
中图分类号
学科分类号
摘要
One form of diamond-like carbon - prepared free of hydrogen by deposition from a filtered C arc - possesses proportions of sp3 bonding in excess of 80%, and is therefore called tetrahedral amorphous carbon (ta-C). Neutron diffraction, high resolution transmission electron microscopy (HRTEM) and electron energy-loss spectroscopy (EELS) have been used to study the atomic structure of the material. Neutron diffraction has shown that the average structure of ta-C is in many ways similar to that of a-Si and a-Ge. HRTEM, used to probe medium-range ordering on a scale of 0.5-1.0 nm, indicates the presence of non-random features, and this raises questions concerning the validity of a random network model. Along with valuable information from EELS on the sp2-bonded component, the structural data are consistent with an amorphous network in which some C atoms occupy hybridisation states intermediate between sp3 and sp2.
引用
收藏
页码:1107 / 1110
相关论文
共 50 条
  • [21] The smoothness of tetrahedral amorphous carbon
    Casiraghi, C
    Ferrari, AC
    Robertson, J
    DIAMOND AND RELATED MATERIALS, 2005, 14 (3-7) : 913 - 920
  • [22] Effect of structure on the secondary electron emission of tetrahedral amorphous carbon film
    Kang, Yongfeng
    Li, Bin
    Zhao, Jingyi
    Ge, Bangzhi
    Weng, Ming
    Shi, Zhongqi
    Zhao, Yuqing
    VACUUM, 2020, 172
  • [23] Structure and properties of tetrahedral amorphous carbon films implanted with Ti ion
    Zhang, Xu
    Wu, Zhenglong
    Wu, Xiangying
    Qin, Lizhao
    Yu, Xiang
    Xu, Yuanzhi
    Zhang, Huixing
    SURFACE & COATINGS TECHNOLOGY, 2007, 201 (9-11): : 5219 - 5222
  • [24] Effect of bias voltage on structure and properties of tetrahedral amorphous carbon film
    Li H.
    Li Y.-T.
    Lin S.-S.
    Shi Q.
    Guo C.-Q.
    Su Y.-F.
    Dai M.-J.
    Surface Technology, 2021, 50 (03): : 284 - 292
  • [25] Effects of nitrogen on the structure and properties of highly tetrahedral amorphous carbon films
    Wei, AX
    Chen, DH
    Ke, N
    Cheung, WY
    Peng, SQ
    Wong, SP
    JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1998, 31 (13) : 1522 - 1526
  • [26] Effect of annealing on structure and haemocompatibility of tetrahedral amorphous hydrogenated carbon films
    Zhang, L.
    Chen, Min
    Li, Zheyi
    Chen, Dihu
    Pan, Shirong
    MATERIALS LETTERS, 2008, 62 (6-7) : 1040 - 1043
  • [27] Cross-sectional structure of tetrahedral amorphous carbon thin films
    Davis, CA
    Knowles, KM
    Amaratunga, GAJ
    SURFACE & COATINGS TECHNOLOGY, 1995, 76 (1-3): : 316 - 321
  • [28] Cross-sectional structure of tetrahedral amorphous carbon thin films
    Davis, C.A.
    Knowles, K.M.
    Amaratunga, G.A.J.
    Surface and Coatings Technology, 1995, 76-77 (1 -3 pt 1): : 316 - 321
  • [30] Ion implantation in tetrahedral amorphous carbon
    McCulloch, D. G.
    Gerstner, E. G.
    McKenzie, D. R.
    Prawer, S.
    Physical Review B: Condensed Matter, 52 (02):