Static and dynamic testing of A/D converters using a VXI based system

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作者：
Cruz Serra, A. [1 ]
Silva Girao, P. [1 ]
机构：
[1] I.S.T., Technical Univ of Lisbon, Lisboa, Portugal
来源：
Conference Record - IEEE Instrumentation and Measurement Technology Conference | 1994年 / 2卷
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页码：903 / 906
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