Spectromicroscopy of silicide phases formed at Ni/Si interfaces

被引：0
|
作者：
Gregoratti, L. [1 ]
Günther, S. [1 ]
Kovac, J. [2 ]
Marsi, M. [1 ]
Kiskinova, M. [1 ]
机构：
[1] Sincrotrone Trieste, Area Science Park, 34012 Basovizza, Trieste, Italy
[2] Inst. Surf. Eng. and Optoelectronics, Teslova 30, 3000 Ljubljana, Slovenia
来源：
Applied Surface Science | 1999年 / 144卷
关键词：
Number:; ERBFMBICT972391; Acronym:; EC; Sponsor: European Commission;
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摘要：
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页码：255 / 259
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