REFLECTIVITY MEASUREMENTS OF THIN SiO2 LAYERS IN THE FAR VUV REGION.

被引：0
|
作者：
Klinkenberg, E.-D. [1 ]
Blau, W. [1 ]
Illinsky, P.P. [1 ]
Gluskin, E.S. [1 ]
机构：
[1] Wilhelm-Pieck-Univ Rostock, Rostock, East Ger, Wilhelm-Pieck-Univ Rostock, Rostock, East Ger
来源：
Nuclear instruments and methods in physics research | 1986年 / A261卷 / 1-2期
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摘要：
10
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页码：140 / 143
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