Study on refractive index of GaAs bulk material by infrared spectroscopic ellipsometry

被引：0
|
作者：
Huang, Zhiming [1 ]
Ji, Huamei [1 ]
Chen, Minhui [1 ]
Shi, Guoliang [1 ]
Chen, Shiwei [1 ]
Chen, Liangyao [1 ]
Chu, Junhao [1 ]
机构：
[1] Shanghai Inst of Technical Physics, Chinese Acad of Sciences, Shanghai, China
来源：
Hongwai Yu Haomibo Xuebao/Journal of Infrared and Millimeter Waves | 1999年 / 18卷 / 01期
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页码：23 / 25
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