共 50 条
- [33] Initial conditions for preparation of thin AlN films by atomic layer deposition 21ST INTERNATIONAL SUMMER SCHOOL ON VACUUM, ELECTRON AND ION TECHNOLOGIES, 2020, 1492
- [37] Determination of micromechanical properties of thin films by beam bending measurements with an atomic force microscope Sensors and Actuators, A: Physical, 1999, 74 (01): : 134 - 138
- [38] Magnetoresistance of patterned NiFe thin films with structures modified by atomic force microscope nanolithography JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2005, 23 (06): : 2390 - 2393