Future prospects for Si CMOS technology

被引：0
|
作者：
Frank, David J. [1 ]
Taur, Yuan [1 ]
Wong, Hon-Sum Philip [1 ]
机构：
[1] IBM T. J. Watson Research Cent, Yorktown Heights, United States
来源：
Annual Device Research Conference Digest | 1999年
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页码：18 / 21
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