Effects of deposition temperature on structure and resistivity of epitaxial La0.5Sr0.5CoO3/CeO2 /YSZ/Si(001) films

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[1] Chen, C.-H.
[2] Wakiya, N.
[3] Shinozaki, K.
[4] Mizutani, N.
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Chen, C.-H. (chenco@sim.ceram.titech.ac.jp) | 1600年 / Trans Tech Publications Ltd期
关键词：
Crystal structure - Electric conductivity - Semiconducting silicon - Substrates - X ray diffraction analysis;
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