Method for fringe enhancement in holographic interferometry for measurement of in-plane displacements

被引：0
|
作者：
Carlsson, Torgny E. [1 ]
Gustafsson, Jonny [1 ]
Abramson, Nils H. [1 ]
机构：
[1] Dept. of Mat. Proc., Indust. Metrol., Royal Institute of Technology, S-100 44 Stockholm, Sweden
来源：
Applied Optics | 1998年 / 37卷 / 10期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：1845 / 1848
相关论文
共 50 条
  • [31] IN-PLANE STRAIN MEASUREMENT BY MULTIPLIED FRINGE SHIFT MOIRE TECHNIQUE
    MATSUMOTO, K
    OKUNO, T
    TAKASHIMA, M
    WATAKE, S
    YAMADA, Y
    JAPANESE JOURNAL OF APPLIED PHYSICS, 1975, 14 : 455 - 459
  • [32] A study on the measurement of in-plane displacement at high temperature by electronic speckle pattern interferometry method
    Kim, KS
    Kim, HT
    Cha, YH
    Jung, HC
    Jarng, SS
    Kim, JY
    Yang, SP
    REVIEW OF PROGRESS IN QUANTITATIVE NONDESTRUCTIVE EVALUATION, VOLS 17A AND 17B, 1998, : 1801 - 1808
  • [33] On the holographic interferometry fringe gradient method for complete surface deformation measurements
    Szyszkowski, W
    Boire, S
    EXPERIMENTAL MECHANICS, 2000, 40 (02) : 164 - 169
  • [34] On the holographic interferometry fringe gradient method for complete surface deformation measurements
    W. Szyszkowski
    S. Boire
    Experimental Mechanics, 2000, 40 : 164 - 169
  • [35] In-plane and out-of-plane holographic interferometry with multibeam photorefractive recordings in sillenite photorefractive crystals
    Thizy, C
    Georges, M
    Scauflaire, A
    Lemaire, P
    Ryhon, S
    Photorefractive Effects, Materials, and Devices, Proceedings Volume, 2003, 87 : 504 - 510
  • [36] A METHOD FOR OBTAINING OUT-OF-PLANE DISPLACEMENTS BY MOIRE INTERFEROMETRY
    PATORSKI, K
    OPTICS COMMUNICATIONS, 1986, 60 (03) : 128 - 132
  • [37] HOLOGRAPHIC INTERFEROMETRY TECHNIQUE UTILIZING 2 PLATES AND RELATIVE FRINGE ORDERS FOR MEASURING MICRO-DISPLACEMENTS
    KING, PW
    APPLIED OPTICS, 1974, 13 (02): : 231 - 232
  • [38] All-Fiber Laser Feedback Interferometry for Sequential Sensing of In-Plane and Out-of-Plane Displacements
    Xie, Zhanwu
    Zhang, Meng
    Li, Jie
    Xia, Wei
    Guo, Dongmei
    PHOTONICS, 2023, 10 (04)
  • [39] Application of holographic interferometry to in-plane and out-of-plane misalignment and deformation measurements in packaging applications
    Nikulin, Vladimir V.
    Khandekar, Rahul
    Bedi, Vijit
    DIMENSIONAL OPTICAL METROLOGY AND INSPECTION FOR PRACTICAL APPLICATIONS IV, 2015, 9489
  • [40] HOLOGRAPHIC-INTERFEROMETRY APPLIED TO MEASUREMENT OF DISPLACEMENTS OF INTERIOR POINTS OF TRANSPARENT BODIES
    SCIAMMARELLA, CA
    GILBERT, JA
    APPLIED OPTICS, 1976, 15 (09): : 2176 - 2182
12345