An automated installation for investigating current-voltage and capacitance-voltage characteristics of semiconductor devices

被引：0
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作者：
Kremin', V.T. [1 ]
机构：
[1] L'vovskij Gosudarstvennyj Univ im., I. Franko, L'vov, Ukraine
来源：
Pribory i Tekhnika Eksperimenta | 1998年 / 41卷 / 01期
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页码：68 / 72
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