Implementation of chaos-based high-speed truly random number generator

被引：0
|
作者：
Yu, Jun [1 ]
Shen, Haibin [1 ]
Yan, Xiaolang [1 ]
机构：
[1] VLSI Inst., Zhejiang Univ., Hangzhou 310027, China
来源：
Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors | 2004年 / 25卷 / 08期
关键词：
Chaos based random number generator - Charge injection - Switched capacitor;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
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页码：1013 / 1018
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