RAPID TESTING FOR NOISE IMMUNITY OF ELECTRONIC DEVICES.

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作者：
Ninomiya, Tamotsu
Harada, Koosuke
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Memoirs of the Kyushu University, Faculty of Engineering | 1977年 / 37卷 / 04期
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摘要：
This paper presents a method of accelerated testing by which the noise immunity of electronic devices or systems can be estimated in a short time through the application of amplified random noise followed by the statistical processing of malfunction data. This method can be applied to various control devices which are operating under noisy circumstances.
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页码：207 / 216
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