Noncontact, electrode-free capacitance/voltage measurement based on general theory of metal-oxide-semiconductor (MOS) structure

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[1] Sakai, Takamasa
[2] Kohno, Motohiro
[3] Hirae, Sadao
[4] Nakatani, Ikuyoshi
[5] Kusuda, Tatsufumi
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Sakai, Takamasa | 1600年 / 32期
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