Z-scan measurement of third and fifth order nonlinearities in single crystal PTS at 1064 nm

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作者：
Lawrence, Brian L. [1 ]
Cha, Myoungsik [1 ]
Torruellas, William E. [1 ]
Stegeman, George I. [1 ]
Etemad, Shahab [1 ]
Baker, Gregory [1 ]
机构：
[1] Univ of Central Florida, Orlando, United States
来源：
Molecular Crystals and Liquid Crystals Science and Technology Section B: Nonlinear Optics | 1995年 / 10卷 / 1-4期
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页码：193 / 205
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