XAFS and X-ray reflectivity studies of buried interfaces

被引:0
|
作者
Univ of Notre Dame, Notre Dame, United States [1 ]
机构
来源
关键词
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
相关论文
共 50 条
  • [21] X-ray photoelectron spectroscopy for nondestructive analysis of buried interfaces
    E. O. Filatova
    A. A. Sokolov
    Journal of Structural Chemistry, 2011, 52 (Suppl 1) : 82 - 89
  • [22] Realtime X-ray reflectometry to see changes at buried interfaces
    Sakurai, K.
    Mizusawa, M.
    Stoev, K.
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2014, 70 : C878 - C878
  • [23] X-ray photoelectron spectroscopy of buried electronic layers and interfaces
    Blackstock, Jason J.
    Stickle, William F.
    Donley, Carrie L.
    Ohlberg, Douglas
    Li, Zhiyong
    Stewart, Duncan R.
    Williams, R. Stanley
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2006, 231
  • [24] X-ray absorption spectroscopy at buried metal polymer interfaces
    Opila, RL
    Konstadinidis, K
    Marcus, MA
    Du, M
    FIRST INTERNATIONAL CONGRESS ON ADHESION SCIENCE AND TECHNOLOGY - INVITED PAPERS: FESTSCHRIFT IN HONOR OF DR. K.L. MITTAL ON THE OCCASION OF HIS 50TH BIRTHDAY, 1998, : 763 - 771
  • [25] X-RAY ABSORPTION FINE-STRUCTURE STUDIES OF BURIED GE-SI INTERFACES
    AEBI, P
    TYLISZCZAK, T
    HITCHCOCK, AP
    JACKMAN, TE
    BARIBEAU, JM
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1991, 9 (03): : 907 - 911
  • [26] Interfaces in organic devices studied with resonant soft x-ray reflectivity
    Yan, Hongping
    Wang, Cheng
    Garcia, Andres
    Swaraj, Sufal
    Gu, Ziran
    McNeill, Christopher R.
    Schuettfort, Torben
    Sohn, Karen E.
    Kramer, Edward J.
    Bazan, Guillermo C.
    Thuc-Quyen Nguyen
    Ade, Harald
    JOURNAL OF APPLIED PHYSICS, 2011, 110 (10)
  • [27] Energy dispersive x-ray reflectivity characterization of semiconductor heterostructures and interfaces
    Chason, E
    Mayer, TM
    Krstelj, ZM
    Sturm, JC
    SEMICONDUCTOR CHARACTERIZATION: PRESENT STATUS AND FUTURE NEEDS, 1996, : 512 - 516
  • [28] Profiles of liquid metal surfaces and interfaces from x-ray reflectivity
    Makov, G
    Kornyshev, AA
    JOURNAL OF CHEMICAL PHYSICS, 1996, 104 (04): : 1693 - 1698
  • [29] Surfaces, interfaces, thin films: In III: X-ray and neutron reflectivity
    Acta Crystallogr Sect A Found Crystallogr, Suppl (C-471):
  • [30] X-ray reflectivity studies on the hydrophobic water gap
    Mezger, Markus
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2014, 247