XAFS and X-ray reflectivity studies of buried interfaces

被引:0
|
作者
Univ of Notre Dame, Notre Dame, United States [1 ]
机构
来源
关键词
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
相关论文
共 50 条
  • [1] XAFS and X-ray reflectivity studies of buried interfaces
    Bunker, BA
    Kropf, AJ
    Kemner, KM
    Mayanovic, RA
    Lu, Q
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1997, 133 (1-4): : 102 - 108
  • [2] GLANCING ANGLE XAFS AND X-RAY REFLECTIVITY STUDIES OF TRANSITION-METAL ALUMINUM INTERFACES
    HEALD, SM
    BARRERA, EV
    CHEN, HY
    FARADAY DISCUSSIONS, 1990, 89 : 21 - 30
  • [3] Probing porosity at buried interfaces using soft x-ray resonant reflectivity
    Nayak, Maheswar
    Lodha, G. S.
    Prasad, T. T.
    Nageswararao, P.
    Sinha, A. K.
    JOURNAL OF APPLIED PHYSICS, 2010, 107 (02)
  • [4] Micro-imaging of buried layers and interfaces in ultrathin films by X-ray reflectivity
    Jiang, Jinxing
    Hirano, Keiichi
    Sakurai, Kenji
    JOURNAL OF APPLIED PHYSICS, 2016, 120 (11)
  • [5] High-energy x-ray reflectivity of buried interfaces created by wafer bonding
    Rieutord, F
    Eymery, J
    Fournel, F
    Buttard, D
    Oeser, R
    Plantevin, O
    Moriceau, H
    Aspar, B
    PHYSICAL REVIEW B, 2001, 63 (12):
  • [6] Determination of interlayer composition at buried interfaces using soft x-ray resonant reflectivity
    Nayak, Maheswar
    Lodha, G. S.
    Sinha, A. K.
    Nandedkar, R. V.
    Shivashankar, S. A.
    APPLIED PHYSICS LETTERS, 2006, 89 (18)
  • [7] XAFS and X-ray reflectivity study of III-V compound native oxide/GaAs interfaces
    Cheong, SK
    Bunker, BA
    Hall, DC
    Snider, GL
    Barrios, PJ
    JOURNAL OF SYNCHROTRON RADIATION, 2001, 8 : 824 - 826
  • [8] X-ray reflectivity study of semiconductor interfaces
    Sanyal, MK
    Datta, A
    Banerjee, S
    Srivastava, AK
    Arora, BM
    Kanakaraju, S
    Mohan, S
    JOURNAL OF SYNCHROTRON RADIATION, 1997, 4 : 185 - 190
  • [9] Study of buried interfaces by X-ray diffraction
    Bourret, A.
    Journal De Physique. IV : JP, 1997, 7 (06): : 6 - 19
  • [10] X-ray diffraction analysis of buried interfaces
    Bourret, A
    JOURNAL DE PHYSIQUE IV, 1997, 7 (C6): : 19 - 29