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- [13] Wafer Level Hermetic Bonding Using Sn/In and Cu/Ti/Au Metallization EPTC: 2008 10TH ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE, VOLS 1-3, 2008, : 767 - 772
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- [19] Relationship between Mechanical and Electrical Properties of Cu Wire and Al Pad Bonding 2016 International Conference on Electronics Packaging (ICEP), 2016, : 508 - 511
- [20] Optimization of wire bonding over Cu-low K pad stack 2003 INTERNATIONAL SYMPOSIUM ON MICROELECTRONICS, 2003, 5288 : 136 - 140