High-speed, two-photon scanning microscope

被引：0
|
作者：
Kim, Ki Hean [1 ]
Buehler, Christof [1 ]
So, Peter T. C. [1 ]
机构：
[1] Department of Mechanical Engineering, Massachusetts Inst. of Technology, 77 Massachusetts Avenue, Cambridge, MA 02139, United States
来源：
Applied Optics | 1999年 / 38卷 / 28期
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页码：6004 / 6009
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