Evaluation of discontinuities in microstrip transmission lines by picosecond time domain reflectometry technique

被引：0
|
作者：
Sharma, B.R. [1 ]
Pawar, V.P. [1 ]
More, N.M. [1 ]
Mehrotra, S.C. [1 ]
机构：
[1] Department of Physics, Dr B A M University, Aurangabad 431 004, India
来源：
IETE Technical Review (Institution of Electronics and Telecommunication Engineers, India) | 2002年 / 19卷 / 03期
关键词：
Glass-epoxy boards - Microstrip transmission lines - Time domain reflectometry;
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摘要：
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页码：119 / 124
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