Fast Fourier transformed electronic speckle contouring for diffuse surfaces profilometry

被引：0
|
作者：
Paoletti, D. [1 ]
Spagnolo, G.Schirripa [1 ]
机构：
[1] Universita Dell'Aquila, Italy
来源：
Optics and Lasers in Engineering | 1994年 / 20卷 / 02期
关键词：
Speckle;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
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页码：87 / 96
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