X-ray grazing incidence diffraction analysis of GaAs/Gap interfaces

被引：0

作者：

Cui, Shufan ^{[1
]}

Wu, Lansheng ^{[1
]}

Wang, Guanming ^{[1
]}

Mai, Zhenhong ^{[1
]}

Wang, Chunyan ^{[1
]}

Wang, Yutian ^{[1
]}

Li, Mei ^{[1
]}

Ge, Zhongjiu ^{[1
]}

机构：

[1] Inst of Physics, The Chinese Acad of Sciences, Beijing, China

来源：

Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors | 1994年 / 15卷 / 02期

关键词：

Diffraction - Epitaxial growth - Interfaces (materials) - Thin films - X rays;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

The interfaces of GaAs/GaP strained layers were investigated by means of X-ray grazing incidence diffraction (GID) combined with conventional X-ray diffraction. The structural parameters including the distortion of thin film crystal cell, the mismatch and relaxation of interface were given. The results show that GID is an effective tool for determining the interface structure of semiconductor epitaxial thin films.

引用

页码：119 / 122

共 50 条

[21] Grazing Incidence X-ray Diffraction Studies of Pharmaceutical Tablets
Koivisto, Mikko
Lehto, Vesa-Pekka
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2005, 61 : C409 - C410
[22] Grazing incidence X-ray diffraction for the study of polycrystalline layers
Simeone, David
Baldinozzi, Gianguido
Gosset, Dominique
Le Caer, Sophie
Berar, Jean-Francois
THIN SOLID FILMS, 2013, 530 : 9 - 13
[23] Investigation of dynamical X-ray back diffraction at grazing incidence
Chen, Shih-Lun
Soo, Yun-Liang
Lin, Bi-Hsuan
Chuang, Tzu-Hung
Tang, Mau-Tsu
OPTICS EXPRESS, 2023, 31 (25): : 41864 - 41874
[24] PHOTOELECTRON YIELD IN X-RAY GRAZING-INCIDENCE DIFFRACTION
IMAMOV, RM
MUKHAMEDZHANOV, EK
MASLOV, AV
PASHAEV, EM
AFANASEV, AM
APPLICATIONS OF SURFACE SCIENCE, 1985, 22-3 (MAY): : 259 - 266
[25] X-ray grazing incidence diffraction on monolayers at the surface of water
Berge, B
Lenne, PF
Renault, A
CURRENT OPINION IN COLLOID & INTERFACE SCIENCE, 1998, 3 (03) : 321 - 326
[26] Grazing incidence in-plane X-ray diffraction in the laboratory
Tanner, BK
Hase, TPA
Lafford, TA
Goorsky, MS
POWDER DIFFRACTION, 2004, 19 (01) : 45 - 48
[27] STUDIES OF SEMICONDUCTOR INTERFACES BY GRAZING-INCIDENCE X-RAY-DIFFRACTION
MATSUI, J
MIZUKI, J
ANNUAL REVIEW OF MATERIALS SCIENCE, 1993, 23 : 295 - 320
[28] Direct measurements of field-induced strain at magnetoelectric interfaces by grazing incidence x-ray diffraction
Abes, M.
Koops, C. T.
Hrkac, S. B.
Greve, H.
Quandt, E.
Collins, S. P.
Murphy, B. M.
Magnussen, O. M.
APPLIED PHYSICS LETTERS, 2013, 102 (01)
[29] X-ray diffraction analysis of buried interfaces
Bourret, A
JOURNAL DE PHYSIQUE IV, 1997, 7 (C6): : 19 - 29
[30] Structural characterisation of a GaAs surface wire structure by triple axis X-ray grazing incidence diffraction
Darowski, N
Paschke, K
Pietsch, U
Wang, K
Forchel, A
Lubbert, D
Baumbach, T
PHYSICA B, 1998, 248 : 104 - 108

← 1 2 3 4 5 →