共 50 条
- [31] DOUBLE CRYSTAL DISPERSION MONOCHROMATOR FOR X-RAY PLANE-WAVE DIFFRACTION NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1991, 308 (1-2): : 407 - 408
- [32] PLANE-WAVE X-RAY IMAGES OF DISLOCATIONS PARALLEL TO THE DIFFRACTION VECTOR PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1984, 83 (01): : 195 - 205
- [33] MEASUREMENT OF LOCAL LATTICE DISTORTION IN SILICON BY IMAGING-PLATE PLANE-WAVE X-RAY TOPOGRAPHY WITH IMAGE MAGNIFICATION JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1995, 34 (1B): : L89 - L92
- [34] APPLICATION OF PLANE-WAVE X-RAY TOPOGRAPHY TO INVESTIGATION OF HEAT-TREATED SILICON OBTAINED BY ZONE-MELTING KRISTALLOGRAFIYA, 1989, 34 (04): : 1051 - 1052
- [35] NOVEL ANALYSIS SYSTEM OF IMAGING-PLATE PLANE-WAVE X-RAY TOPOGRAPHY FOR CHARACTERIZING LATTICE DISTORTION IN SILICON JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1994, 33 (6B): : L823 - L825
- [36] A DOUBLE-LINE IMAGE OF A DISLOCATION IN A SILICON SINGLE-CRYSTAL OBSERVED BY X-RAY PLANE-WAVE TOPOGRAPHY PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1981, 43 (04): : 935 - 944
- [37] Observation of subnanometre-high surface topography with X-ray reflection phase-contrast microscopy Nature Physics, 2006, 2 : 700 - 704
- [39] OBSERVATION OF MINUTE STRAIN FIELDS IN A FLOATING-ZONE-GROWN SILICON CRYSTAL CONTAINING D-DEFECTS BY MEANS OF PLANE-WAVE X-RAY TOPOGRAPHY PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1994, 69 (06): : 1179 - 1187
- [40] X-RAY FOLLOWING OF TRANSFORMATION OF NON-CRYSTALLINE AL203 INTO CORUNDUM JOURNAL OF INORGANIC & NUCLEAR CHEMISTRY, 1968, 30 (01): : 59 - &