ROLE OF STRUCTURAL STABILITY IN THE RELIABILITY OF MICROWAVE VACUUM DEVICES.

被引：0

作者：

Yeh, Hsien-Yang ^{[1
]}

机构：

[1] California State Univ, Long Beach,, CA, USA, California State Univ, Long Beach, CA, USA

来源：

IEEE Transactions on Electron Devices | 1987年 / ED-34卷 / 02期

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摘要：

引用

页码：494 / 497

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