ROLE OF STRUCTURAL STABILITY IN THE RELIABILITY OF MICROWAVE VACUUM DEVICES.

被引：0
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作者：
Yeh, Hsien-Yang [1 ]
机构：
[1] California State Univ, Long Beach,, CA, USA, California State Univ, Long Beach, CA, USA
来源：
IEEE Transactions on Electron Devices | 1987年 / ED-34卷 / 02期
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摘要：
9
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页码：494 / 497
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