DIL Connectors in Equipment with High Reliability.

被引：0
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作者：
Ulbricht, Helmar
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来源：
Elektronik Munchen | 1983年 / 32卷 / 24期
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摘要：
Proceeding from the tasks and the major electrical parameters of DIL connectors, tests and stress cycles are described with the aid of which the reliability of these contacting systems can be judged. The causes of faulty DIL connections are explained by way of examples.
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页码：43 / 48
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