REALISTIC YIELD SIMULATION FOR VLSIC STRUCTURAL FAILURES.

被引：0
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作者：
Chen, Ihao [1 ]
Strojwas, Andrzej J. [1 ]
机构：
[1] Carnegie-Mellon Univ, Pittsburgh,, PA, USA, Carnegie-Mellon Univ, Pittsburgh, PA, USA
来源：
| 1600年 / CAD-6期
关键词：
DEFECT STATISTICS - HIERARCHICAL MODEL - VLSIC STRUCTURAL FAILURES;
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