High temperature materials characterization enhanced by nondestructive imaging

被引：0
|
作者：
Pilgrim, S.M. [1 ]
机构：
[1] NYSCC, Alfred University, Alfred, NY, United States
来源：
Glass Researcher | 2001年 / 10-11卷 / 2-1期
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学科分类号：
摘要：
Ultrasonic imaging
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页码：42 / 43
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