RELIABILITY PREDICTION FROM ASSESSMENT TESTS ON PLASTIC ENCAPSULATED SEMICONDUCOR DEVICES.

被引：0
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作者：
Dhanasekharan, N. [1 ]
机构：
[1] BEL Bangalore, QA Div, Bangalore,, India, BEL Bangalore, QA Div, Bangalore, India
来源：
QR journal | 1985年 / 12卷 / 03期
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页码：115 / 119
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