Low-temperature scanning tunneling microscopy

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机构：
[1] Reihl, B.
[2] Gimzewski, J.K.
[3] Schlittler, R.
[4] Tschudy, M.
[5] Bernd, R.
[6] Gaisch, R.
[7] Schneider, W.D.
来源：
Reihl, B. | 1600年 / Publ by Elsevier Science Publishers B.V., Amsterdam, Netherlands卷 / 197期
关键词：
Low temperature engineering;
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