Minimax approach to accelerated life tests

被引：0
|
作者：
Ginebra, Josep [1 ]
Sen, Ananda [1 ]
机构：
[1] E.T.S.E.I. de Barcelona, Barcelona, Spain
来源：
IEEE Transactions on Reliability | 1998年 / 47卷 / 3 pt 1期
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摘要：
15
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页码：261 / 267
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