Scanning tunneling microscopy on Sn/Si(110) system

被引：0
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作者：
An, Toshu [1 ]
Yoshimura, Masamichi [1 ]
Ueda, Kazuyuki [1 ]
机构：
[1] Toyota Technological Inst, Nagoya, Japan
来源：
Applied Surface Science | 1998年 / 130-132卷
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页码：118 / 122
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