Scanning nonlinear dielectric microscope with submicron resolution

被引：0
|
作者：
Cho, Yasuo [1 ]
Matsuura, Kaori [1 ]
Yamanouchi, Kazuhiko [1 ]
机构：
[1] Tohoku Univ, Sendai, Japan
来源：
IEEE International Symposium on Applications of Ferroelectrics | 1998年
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页码：435 / 438
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