共 50 条
- [23] Study of the interface roughness using polarized neutron and X-ray reflectivity on MBE permalloy thin films J Phys Chem Solids, 8 (1491-1494):
- [29] Characterization of multilayers of thin films by measurement of X-ray specular reflectivity VIDE-SCIENCE TECHNIQUE ET APPLICATIONS, 2002, 57 (304): : 387 - 429