Layer structure reformation of surface-stabilized ferroelectric liquid crystal treated with electric field

The smectic layer formation caused by the electric field treatment (EFT) was studied in terms of X-ray diffraction profiles, electro optical (EO) response, polarization reversal current and transitional dielectric constant (TDC) measurement. From the X-ray diffraction study, it was found that the chevron layer structure was reformed to a quasi-bookshelf structure by applying a suitable amplitude of EFT voltage.